IJERGS · Volume 3, Issue 2 · March-April 2015 Edition
TRANSIENT STABILITY ANALYSIS AND ITS INTENSIFICATION IN MICROGRID
| Journal | International Journal of Engineering Research and General Science (IJERGS) |
|---|---|
| ISSN | 2091-2730 |
| Volume | 3 |
| Issue | 2 |
| Edition | March-April 2015 Edition |
| Year | 2015 |
| Pages | page 1143-1153 |
| Publisher | P&R Publication |
How to cite
Bhakti Nitve, Ramesh L. Chakrasali (2015). TRANSIENT STABILITY ANALYSIS AND ITS INTENSIFICATION IN MICROGRID. International Journal of Engineering Research and General Science, 3(2), 1143-1153. ISSN 2091-2730. https://www.ijergs.org/article/v3-i2-160.html